Group component tests to reduce CI time (#11134)

2025-10-30 06:33:51 +00:00 · 2025-10-11 08:21:45 -10:00
parent 6a11700a6b
commit dcf2697a2a
1808 changed files with 8564 additions and 5758 deletions
--- a/tests/components/adc/test.esp32-p4-idf.yaml
+++ b/tests/components/adc/test.esp32-p4-idf.yaml
@@ -1,6 +1,12 @@
-packages:
-  base: !include common.yaml
-
 sensor:
-  - id: !extend my_sensor
-    pin: GPIO50
+  - id: my_sensor
+    platform: adc
+    pin: GPIO16
+    name: ADC Test sensor
+    update_interval: "1:01"
+    attenuation: 2.5db
+    unit_of_measurement: "°C"
+    icon: "mdi:water-percent"
+    accuracy_decimals: 5
+    setup_priority: -100
+    force_update: true