[ci] Reduce release time by removing 21 redundant ESP32-S3 IDF tests (#11850)

tests/components/uart/test-uart_max_with_usb_serial_jtag.esp32-s3-idf.yaml

@@ -1,48 +0,0 @@
-<<: !include ../logger/common-usb_serial_jtag.yaml
-
-esphome:
-  on_boot:
-    then:
-      - uart.write:
-          id: uart_1
-          data: 'Hello World'
-      - uart.write:
-          id: uart_1
-          data: [0x00, 0x20, 0x42]
-
-uart:
-  - id: uart_1
-    tx_pin: 4
-    rx_pin: 5
-    flow_control_pin: 6
-    baud_rate: 9600
-    data_bits: 8
-    rx_buffer_size: 512
-    rx_full_threshold: 10
-    rx_timeout: 1
-    parity: EVEN
-    stop_bits: 2
-
-  - id: uart_2
-    tx_pin: 7
-    rx_pin: 8
-    flow_control_pin: 9
-    baud_rate: 9600
-    data_bits: 8
-    rx_buffer_size: 512
-    rx_full_threshold: 10
-    rx_timeout: 1
-    parity: EVEN
-    stop_bits: 2
-
-  - id: uart_3
-    tx_pin: 10
-    rx_pin: 11
-    flow_control_pin: 12
-    baud_rate: 9600
-    data_bits: 8
-    rx_buffer_size: 512
-    rx_full_threshold: 10
-    rx_timeout: 1
-    parity: EVEN
-    stop_bits: 2