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	Group component tests to reduce CI time (#11134)
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						 Jesse Hills
						Jesse Hills
					
				
			
			
				
	
			
			
			
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			| @@ -0,0 +1,13 @@ | ||||
| # Common I2C configuration for ESP32 IDF tests - Low Frequency (10kHz) | ||||
| # For components that require I2C frequency <= 15kHz (ags10, ltr501, ltr_als_ps) | ||||
|  | ||||
| substitutions: | ||||
|   scl_pin: GPIO16 | ||||
|   sda_pin: GPIO17 | ||||
|  | ||||
| i2c: | ||||
|   - id: i2c_bus | ||||
|     scl: ${scl_pin} | ||||
|     sda: ${sda_pin} | ||||
|     frequency: 10kHz | ||||
|     scan: true | ||||
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