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Group component tests to reduce CI time (#11134)
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committed by
Jesse Hills
parent
132e949927
commit
2864bf1674
@@ -1,6 +1,6 @@
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ttp229_bsf:
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scl_pin: ${scl_pin}
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sdo_pin: ${sdo_pin}
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scl_pin: ${ttp229_scl_pin}
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sdo_pin: ${ttp229_sdo_pin}
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binary_sensor:
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- platform: ttp229_bsf
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