Group component tests to reduce CI time (#11134)

tests/components/st7735/common.yaml

@@ -1,8 +1,3 @@
-spi:
-  - id: spi_st7735
-    clk_pin: ${clk_pin}
-    mosi_pin: ${mosi_pin}
-
 display:
   - platform: st7735
     model: INITR_18BLACKTAB
@@ -14,15 +9,15 @@ display:
     col_start: 0
     row_start: 0
     pages:
-      - id: page1
+      - id: st7735_page1
         lambda: |-
           it.rectangle(0, 0, it.get_width(), it.get_height());
-      - id: page2
+      - id: st7735_page2
         lambda: |-
           it.rectangle(0, 0, it.get_width(), it.get_height());
     on_page_change:
-      from: page1
-      to: page2
+      from: st7735_page1
+      to: st7735_page2
       then:
         lambda: |-
           ESP_LOGD("display", "1 -> 2");

tests/components/st7735/test.esp32-c3-idf.yaml

@@ -1,9 +1,8 @@
 substitutions:
-  clk_pin: GPIO6
-  mosi_pin: GPIO7
-  miso_pin: GPIO5
   cs_pin: GPIO8
   dc_pin: GPIO9
   reset_pin: GPIO10
+packages:
+  spi: !include ../../test_build_components/common/spi/esp32-c3-idf.yaml
 
 <<: !include common.yaml

tests/components/st7735/test.esp32-idf.yaml

@@ -1,8 +1,9 @@
 substitutions:
-  clk_pin: GPIO16
-  mosi_pin: GPIO17
   cs_pin: GPIO12
   dc_pin: GPIO13
   reset_pin: GPIO14
 
+packages:
+  spi: !include ../../test_build_components/common/spi/esp32-idf.yaml
+
 <<: !include common.yaml

tests/components/st7735/test.esp8266-ard.yaml

@@ -1,9 +1,12 @@
 substitutions:
-  clk_pin: GPIO14
-  mosi_pin: GPIO13
+  clk_pin: GPIO0
+  mosi_pin: GPIO2
   miso_pin: GPIO12
   cs_pin: GPIO5
   dc_pin: GPIO15
   reset_pin: GPIO16
 
+packages:
+  spi: !include ../../test_build_components/common/spi/esp8266-ard.yaml
+
 <<: !include common.yaml

tests/components/st7735/test.rp2040-ard.yaml

@@ -6,4 +6,7 @@ substitutions:
   dc_pin: GPIO15
   reset_pin: GPIO16
 
+packages:
+  spi: !include ../../test_build_components/common/spi/rp2040-ard.yaml
+
 <<: !include common.yaml