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Group component tests to reduce CI time (#11134)
This commit is contained in:
committed by
Jesse Hills
parent
132e949927
commit
2864bf1674
@@ -1,11 +1,6 @@
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uart:
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- id: uart_selec_meter
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tx_pin: ${tx_pin}
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rx_pin: ${rx_pin}
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baud_rate: 9600
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sensor:
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- platform: selec_meter
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modbus_id: modbus_bus
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total_active_energy:
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name: SelecEM2M Total Active Energy
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import_active_energy:
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@@ -1,5 +1,7 @@
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substitutions:
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tx_pin: GPIO4
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rx_pin: GPIO5
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flow_control_pin: GPIO10
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packages:
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modbus: !include ../../test_build_components/common/modbus/esp32-c3-idf.yaml
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<<: !include common.yaml
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@@ -1,5 +1,9 @@
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substitutions:
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tx_pin: GPIO17
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rx_pin: GPIO16
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tx_pin: GPIO4
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rx_pin: GPIO5
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flow_control_pin: GPIO26
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packages:
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modbus: !include ../../test_build_components/common/modbus/esp32-idf.yaml
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<<: !include common.yaml
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@@ -1,5 +1,9 @@
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substitutions:
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tx_pin: GPIO4
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rx_pin: GPIO5
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tx_pin: GPIO0
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rx_pin: GPIO2
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flow_control_pin: GPIO4
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packages:
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modbus: !include ../../test_build_components/common/modbus/esp8266-ard.yaml
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<<: !include common.yaml
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@@ -1,5 +1,9 @@
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substitutions:
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tx_pin: GPIO4
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rx_pin: GPIO5
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flow_control_pin: GPIO6
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packages:
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modbus: !include ../../test_build_components/common/modbus/rp2040-ard.yaml
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<<: !include common.yaml
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