Group component tests to reduce CI time (#11134)

2025-10-31 07:03:55 +00:00 · 2025-10-11 08:21:45 -10:00
parent 132e949927
commit 2864bf1674
1808 changed files with 8564 additions and 5758 deletions
--- a/tests/components/seeed_mr60fda2/common.yaml
+++ b/tests/components/seeed_mr60fda2/common.yaml
@@ -1,14 +1,5 @@
-uart:
-  - id: seeed_mr60fda2_uart
-    tx_pin: ${uart_tx_pin}
-    rx_pin: ${uart_rx_pin}
-    baud_rate: 115200
-    parity: NONE
-    stop_bits: 1
-
 seeed_mr60fda2:
  id: my_seeed_mr60fda2
-  uart_id: seeed_mr60fda2_uart

 binary_sensor:
  - platform: seeed_mr60fda2
--- a/tests/components/seeed_mr60fda2/test.esp32-c3-idf.yaml
+++ b/tests/components/seeed_mr60fda2/test.esp32-c3-idf.yaml
@@ -1,5 +1,4 @@
-substitutions:
-  uart_tx_pin: GPIO5
-  uart_rx_pin: GPIO4
+packages:
+  uart_115200: !include ../../test_build_components/common/uart_115200/esp32-c3-idf.yaml

 <<: !include common.yaml