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Group component tests to reduce CI time (#11134)
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committed by
Jesse Hills
parent
132e949927
commit
2864bf1674
@@ -1,11 +1,3 @@
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uart:
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- id: seeed_mr60fda2_uart
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tx_pin: ${uart_tx_pin}
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rx_pin: ${uart_rx_pin}
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baud_rate: 115200
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parity: NONE
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stop_bits: 1
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seeed_mr60bha2:
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id: my_seeed_mr60bha2
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