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Group component tests to reduce CI time (#11134)
This commit is contained in:
committed by
Jesse Hills
parent
132e949927
commit
2864bf1674
@@ -1,11 +1,6 @@
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uart:
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- id: uart_sdm_meter
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tx_pin: ${tx_pin}
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rx_pin: ${rx_pin}
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baud_rate: 9600
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sensor:
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- platform: sdm_meter
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modbus_id: modbus_bus
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phase_a:
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current:
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name: Phase A Current
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@@ -1,5 +1,5 @@
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substitutions:
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tx_pin: GPIO4
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rx_pin: GPIO5
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packages:
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modbus: !include ../../test_build_components/common/modbus/esp32-c3-idf.yaml
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<<: !include common.yaml
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@@ -1,5 +1,8 @@
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substitutions:
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tx_pin: GPIO17
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rx_pin: GPIO16
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tx_pin: GPIO4
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rx_pin: GPIO5
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packages:
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modbus: !include ../../test_build_components/common/modbus/esp32-idf.yaml
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<<: !include common.yaml
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@@ -1,5 +1,8 @@
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substitutions:
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tx_pin: GPIO4
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rx_pin: GPIO5
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tx_pin: GPIO0
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rx_pin: GPIO2
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packages:
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modbus: !include ../../test_build_components/common/modbus/esp8266-ard.yaml
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<<: !include common.yaml
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@@ -2,4 +2,7 @@ substitutions:
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tx_pin: GPIO4
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rx_pin: GPIO5
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packages:
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modbus: !include ../../test_build_components/common/modbus/rp2040-ard.yaml
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<<: !include common.yaml
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