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	Group component tests to reduce CI time (#11134)
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						 Jesse Hills
						Jesse Hills
					
				
			
			
				
	
			
			
			
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					2864bf1674
				
			| @@ -1,9 +1,8 @@ | ||||
| substitutions: | ||||
|   clk_pin: GPIO6 | ||||
|   mosi_pin: GPIO7 | ||||
|   miso_pin: GPIO5 | ||||
|   cs_pin: GPIO8 | ||||
|   dc_pin: GPIO9 | ||||
|   reset_pin: GPIO10 | ||||
| packages: | ||||
|   spi: !include ../../test_build_components/common/spi/esp32-c3-idf.yaml | ||||
|  | ||||
| <<: !include common.yaml | ||||
|   | ||||
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