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Group component tests to reduce CI time (#11134)
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committed by
Jesse Hills
parent
132e949927
commit
2864bf1674
@@ -1,8 +1,5 @@
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substitutions:
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tx_pin: GPIO4
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rx_pin: GPIO5
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packages:
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uart: !include ../../test_build_components/common/uart/esp32-c3-idf.yaml
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base: !include common.yaml
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display:
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