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Group component tests to reduce CI time (#11134)
This commit is contained in:
committed by
Jesse Hills
parent
132e949927
commit
2864bf1674
@@ -1,10 +1,6 @@
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i2c:
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- id: i2c_max9611
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scl: ${scl_pin}
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sda: ${sda_pin}
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sensor:
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- platform: max9611
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i2c_id: i2c_bus
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shunt_resistance: 0.2 ohm
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gain: 1X
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voltage:
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@@ -1,5 +1,4 @@
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substitutions:
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scl_pin: GPIO5
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sda_pin: GPIO4
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packages:
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i2c: !include ../../test_build_components/common/i2c/esp32-c3-idf.yaml
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<<: !include common.yaml
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@@ -1,5 +1,4 @@
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substitutions:
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scl_pin: GPIO16
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sda_pin: GPIO17
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packages:
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i2c: !include ../../test_build_components/common/i2c/esp32-idf.yaml
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<<: !include common.yaml
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@@ -1,5 +1,4 @@
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substitutions:
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scl_pin: GPIO5
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sda_pin: GPIO4
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packages:
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i2c: !include ../../test_build_components/common/i2c/esp8266-ard.yaml
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<<: !include common.yaml
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@@ -1,5 +1,4 @@
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substitutions:
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scl_pin: GPIO5
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sda_pin: GPIO4
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packages:
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i2c: !include ../../test_build_components/common/i2c/rp2040-ard.yaml
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<<: !include common.yaml
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