Group component tests to reduce CI time (#11134)

2025-10-31 07:03:55 +00:00 · 2025-10-11 08:21:45 -10:00
parent 132e949927
commit 2864bf1674
1808 changed files with 8564 additions and 5758 deletions
--- a/tests/components/kamstrup_kmp/common.yaml
+++ b/tests/components/kamstrup_kmp/common.yaml
@@ -1,9 +1,3 @@
-uart:
-  tx_pin: ${uart_tx_pin}
-  rx_pin: ${uart_rx_pin}
-  baud_rate: 1200
-  stop_bits: 2
-
 sensor:
  - platform: kamstrup_kmp
    heat_energy:
--- a/tests/components/kamstrup_kmp/test.esp32-idf.yaml
+++ b/tests/components/kamstrup_kmp/test.esp32-idf.yaml
@@ -1,5 +1,4 @@
-substitutions:
-  uart_tx_pin: GPIO1
-  uart_rx_pin: GPIO3
+packages:
+  uart_1200: !include ../../test_build_components/common/uart_1200/esp32-idf.yaml

 <<: !include common.yaml
--- a/tests/components/kamstrup_kmp/test.esp8266-ard.yaml
+++ b/tests/components/kamstrup_kmp/test.esp8266-ard.yaml
@@ -2,4 +2,7 @@ substitutions:
  uart_tx_pin: GPIO1
  uart_rx_pin: GPIO3

+packages:
+  uart_1200: !include ../../test_build_components/common/uart_1200/esp8266-ard.yaml
+
 <<: !include common.yaml