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Group component tests to reduce CI time (#11134)
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committed by
Jesse Hills
parent
132e949927
commit
2864bf1674
@@ -1,6 +1,6 @@
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substitutions:
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binary_sensor_pin: GPIO12
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output_pin: GPIO13
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switch_pin: GPIO14
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binary_sensor_pin: GPIO0
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output_pin: GPIO2
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switch_pin: GPIO15
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<<: !include common.yaml
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