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Group component tests to reduce CI time (#11134)
This commit is contained in:
committed by
Jesse Hills
parent
132e949927
commit
2864bf1674
@@ -1,12 +1,6 @@
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uart:
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- id: uart_gcja5
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tx_pin: ${tx_pin}
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rx_pin: ${rx_pin}
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baud_rate: 9600
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parity: EVEN
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sensor:
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- platform: gcja5
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uart_id: uart_bus
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pm_1_0:
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name: "Particulate Matter <1.0µm Concentration"
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pm_2_5:
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@@ -1,5 +1,4 @@
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substitutions:
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tx_pin: GPIO4
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rx_pin: GPIO5
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packages:
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uart_9600_even: !include ../../test_build_components/common/uart_9600_even/esp32-c3-idf.yaml
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<<: !include common.yaml
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@@ -1,5 +1,4 @@
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substitutions:
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tx_pin: GPIO12
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rx_pin: GPIO14
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packages:
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uart_9600_even: !include ../../test_build_components/common/uart_9600_even/esp32-idf.yaml
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<<: !include common.yaml
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@@ -1,5 +1,4 @@
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substitutions:
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tx_pin: GPIO4
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rx_pin: GPIO5
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packages:
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uart_9600_even: !include ../../test_build_components/common/uart_9600_even/esp8266-ard.yaml
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<<: !include common.yaml
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@@ -1,5 +1,4 @@
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substitutions:
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tx_pin: GPIO4
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rx_pin: GPIO5
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packages:
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uart_9600_even: !include ../../test_build_components/common/uart_9600_even/rp2040-ard.yaml
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<<: !include common.yaml
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