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Group component tests to reduce CI time (#11134)
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committed by
Jesse Hills
parent
132e949927
commit
2864bf1674
@@ -9,12 +9,6 @@ esphome:
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finger_id: 2
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- fingerprint_grow.delete_all:
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uart:
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- id: uart_fingerprint_grow
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tx_pin: ${tx_pin}
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rx_pin: ${rx_pin}
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baud_rate: 57600
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fingerprint_grow:
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sensing_pin: ${sensing_pin}
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password: 0x12FE37DC
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