Group component tests to reduce CI time (#11134)

tests/components/fingerprint_grow/common.yaml

@@ -9,12 +9,6 @@ esphome:
           finger_id: 2
       - fingerprint_grow.delete_all:
 
-uart:
-  - id: uart_fingerprint_grow
-    tx_pin: ${tx_pin}
-    rx_pin: ${rx_pin}
-    baud_rate: 57600
-
 fingerprint_grow:
   sensing_pin: ${sensing_pin}
   password: 0x12FE37DC

tests/components/fingerprint_grow/test.esp32-c3-idf.yaml

@@ -1,6 +1,6 @@
 substitutions:
-  tx_pin: GPIO4
-  rx_pin: GPIO5
   sensing_pin: GPIO6
+packages:
+  uart: !include ../../test_build_components/common/uart/esp32-c3-idf.yaml
 
 <<: !include common.yaml

tests/components/fingerprint_grow/test.esp32-idf.yaml

@@ -3,4 +3,7 @@ substitutions:
   rx_pin: GPIO14
   sensing_pin: GPIO15
 
+packages:
+  uart: !include ../../test_build_components/common/uart/esp32-idf.yaml
+
 <<: !include common.yaml

tests/components/fingerprint_grow/test.esp8266-ard.yaml

@@ -1,6 +1,9 @@
 substitutions:
-  tx_pin: GPIO4
-  rx_pin: GPIO5
+  tx_pin: GPIO0
+  rx_pin: GPIO2
   sensing_pin: GPIO15
 
+packages:
+  uart: !include ../../test_build_components/common/uart/esp8266-ard.yaml
+
 <<: !include common.yaml

tests/components/fingerprint_grow/test.rp2040-ard.yaml

@@ -3,4 +3,7 @@ substitutions:
   rx_pin: GPIO5
   sensing_pin: GPIO6
 
+packages:
+  uart: !include ../../test_build_components/common/uart/rp2040-ard.yaml
+
 <<: !include common.yaml