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	Group component tests to reduce CI time (#11134)
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					committed by
					
						 Jesse Hills
						Jesse Hills
					
				
			
			
				
	
			
			
			
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					2864bf1674
				
			| @@ -1,19 +1,14 @@ | ||||
| i2c: | ||||
|   - id: i2c_chsc6x | ||||
|     scl: 3 | ||||
|     sda: 9 | ||||
|  | ||||
| spi: | ||||
|   clk_pin: 5 | ||||
|   mosi_pin: 4 | ||||
| packages: | ||||
|   i2c: !include ../../test_build_components/common/i2c/esp32-c3-idf.yaml | ||||
|   spi: !include ../../test_build_components/common/spi/esp32-c3-idf.yaml | ||||
|  | ||||
| display: | ||||
|   - platform: ili9xxx | ||||
|     id: ili9xxx_display | ||||
|     model: GC9A01A | ||||
|     invert_colors: True | ||||
|     cs_pin: 18 | ||||
|     dc_pin: 19 | ||||
|     cs_pin: 10 | ||||
|     dc_pin: 6 | ||||
|     pages: | ||||
|       - id: page1 | ||||
|         lambda: |- | ||||
|   | ||||
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