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	Group component tests to reduce CI time (#11134)
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						 Jesse Hills
						Jesse Hills
					
				
			
			
				
	
			
			
			
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			| @@ -1,9 +1,5 @@ | ||||
| i2c: | ||||
|   - id: i2c_as3935 | ||||
|     scl: ${scl_pin} | ||||
|     sda: ${sda_pin} | ||||
|  | ||||
| as3935_i2c: | ||||
|   i2c_id: i2c_bus | ||||
|   irq_pin: ${irq_pin} | ||||
|  | ||||
| binary_sensor: | ||||
|   | ||||
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