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Group component tests to reduce CI time (#11134)
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committed by
Jesse Hills
parent
132e949927
commit
2864bf1674
@@ -1,9 +1,5 @@
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i2c:
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- id: i2c_apds9960
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scl: ${scl_pin}
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sda: ${sda_pin}
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apds9960:
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i2c_id: i2c_bus
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address: 0x20
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update_interval: 60s
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